SRIM Calculator

Calculate stopping power, range, and energy loss of ions in materials using SRIM principles

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About This Tool

This SRIM (Stopping and Range of Ions in Matter) online calculator allows researchers, students, and engineers to analyze ion interactions with materials. Calculate key parameters including stopping power (both nuclear and electronic), projected range, range straggling, and energy loss profiles. The tool implements standard SRIM algorithms for accurate ion-material interaction analysis without requiring complex software installation. Perfect for semiconductor manufacturing, materials science research, and radiation physics applications.

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How to Use

Select the incident ion type from the dropdown menu
Choose the target material from the available options
Enter the incident ion energy in keV
Specify the target thickness in nanometers
Click 'Calculate SRIM Parameters' to run the analysis
View detailed results including stopping power, range, straggling, and energy loss profile
Use the 'Reset' button to clear all inputs and start over

Frequently Asked Questions

Find Quick Answers

What is SRIM and what does it calculate?

SRIM (Stopping and Range of Ions in Matter) is a collection of software packages that calculate the stopping power and range of ions in matter. This calculator determines key parameters including nuclear and electronic stopping power, projected range, range straggling, and energy loss of ions as they travel through materials.

What ions and materials are supported?

The calculator supports common ions (H, He, B, P, As, Si, Ge, Ar) and materials (Si, SiO2, GaAs, Al, Cu, Au, Si3N4, Photoresist) typically used in semiconductor manufacturing and materials research. All data is based on established SRIM reference values.

How accurate are the calculations?

The calculations use established SRIM algorithms and reference data for ion-material interactions. While simplified compared to full SRIM software, they provide accurate estimates for most practical applications in research and engineering.

What units are used in the calculations?

Incident energy is in keV (kilo-electron volts), target thickness in nm (nanometers), stopping power in eV/Å (electron volts per angstrom), range in nm, and straggling in nm. All results can be converted to other units as needed.

Can I calculate ion implantation profiles?

Yes, the calculator provides the projected range and straggling parameters needed to model Gaussian implantation profiles. The energy loss profile helps understand how ions deposit energy throughout the target material.

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